Blanka Pop

Developed a custom video scrubber/timeline controller as part of a professional surveillance software suite. The control allows users to navigate and review video footage across multiple camera feeds with precision and ease.

KEY FEATURES
• Multi-channel timeline visualization for simultaneous camera feeds (e.g., basement, entry door, garage).
• Interactive time range selection for quick navigation and export of video segments.
• Real-time visual representation of motion events and recording activity across channels.
• Full playback controls (play, pause, seek, frame-skip, export) integrated into the timeline.
• Custom styling and animations implemented using XAML for a modern, responsive UI.

RESPONSIBILITIES
• Designed and built the scrubber control from scratch using WPF and XAML.
• Ensured smooth performance with large datasets and long-duration video timelines.
• Collaborated with back-end developers to bind playback and search features to video streams.
• Followed the MVVM design pattern to maintain clean, testable, and maintainable code.

Worked on a specialized 3D simulation software that visualizes the movement of Mitsubishi CNC machines based on real-world CNC code (G-code, M-code). The tool is designed to simulate the machining process in a virtual environment, allowing users to verify tool paths, detect collisions, and optimize CNC programs before actual execution.

KEY FEATURES
• Accurate 3D simulation of CNC machine movements, including axis control, tool changes, and spindle behavior.
• Parsing and interpretation of complex CNC programs with support for machine-specific extensions.
• Real-time playback and step-through functionality for program debugging and analysis.
• Legacy system enhancement: refactored existing back-end logic and extended functionality without breaking existing behavior.

RESPONSIBILITIES
• Focused on back-end development: debugging, maintaining, and enhancing a large legacy codebase.
• Implemented new simulation features and resolved critical bugs in movement and toolpath logic.
• Collaborated with domain experts and front-end developers to ensure physical accuracy and usability.
• Conducted in-depth analysis of CNC program behavior to ensure faithful simulation of machine logic.

The project is a modular WPF application designed for precision optical measurement and automated device alignment in industrial environments. The platform integrates advanced image processing, workflows, and real-time device control, supporting both physical and simulated hardware (cameras, probes, stages, GPIO). Key features include automated image alignment, measurement result visualization, recipe management, and robust background task orchestration.

ROLES AND RESPONSIBILITIES
• Designed and implemented core libraries for automated image alignment, measurement processing, and workflow management in a modular WPF application.
• Developed and maintained reusable UI components for procedure management, measurement visualization, and device control, ensuring a consistent and user-friendly experience.
• Built and tested device simulators to support development and QA in hardware-independent scenarios.
• Automated configuration and parameter management using asynchronous database access and serialization techniques.
• Collaborated with cross-functional teams to deliver new features, resolve issues, and ensure code quality through code reviews and unit testing.

A .NET WPF application for interferometric signal processing and fully automated measuring workflows of wafer die measurements.

• Signal processing module:
Developed a signal processing module that decodes optical impulses from an interferometric device and computes the physical structure of scanned materials with submicron precision.

• Wafer measurement routines:
Implemented automated die/wafer measurement routines, enabling full-wafer analysis with minimal manual intervention.

• Results analysis:
Built a comprehensive results-analysis system providing detailed per-component measurements alongside overall surface shape, bow, and warping metrics.